Electrical and Electronic Engineering
Scopus-indexed Journals
Publisher: Institute of Electrical and Electronics Engineers
Cite Score: 69.4 Open Access No Publisher: Nature Publishing Group
Cite Score: 57.3 Open Access No Publisher: Nature Publishing Group
Cite Score: 41.3 Open Access No Publisher: Elsevier BV
Cite Score: 27.7 Open Access No Publisher: Institute of Electrical and Electronics Engineers
Cite Score: 25.3 Open Access No Publisher: Institute of Electrical and Electronics Engineers
Cite Score: 24.6 Open Access No Publisher: Springer Nature Switzerland AG
Cite Score: 22.9 Open Access Yes Publisher: Springer Open
Cite Score: 22.8 Open Access Yes Publisher: Marcel Dekker Inc.
Cite Score: 22.2 Open Access No Publisher: Institute of Electrical and Electronics Engineers
Cite Score: 22.0 Open Access No Publisher: IEEE Advancing Technology for Humanity
Cite Score: 22.0 Open Access No Publisher: Institute of Electrical and Electronics Engineers
Cite Score: 21.5 Open Access No Publisher: Institute of Electrical and Electronics Engineers
Cite Score: 21.3 Open Access No Publisher: Institute of Electrical and Electronics Engineers
Cite Score: 21.2 Open Access No Publisher: Taylor & Francis
Cite Score: 19.6 Open Access No Publisher: Royal Society of Chemistry
Cite Score: 19.2 Open Access No Publisher: Nature Publishing Group
Cite Score: 19.1 Open Access Yes Publisher: Institute of Electrical and Electronics Engineers
Cite Score: 18.8 Open Access No Publisher: IEEE Advancing Technology for Humanity
Cite Score: 18.2 Open Access No Publisher: Institute of Electrical and Electronics Engineers
Cite Score: 17.1 Open Access No Publisher: John Wiley & Sons Inc.
Cite Score: 16.5 Open Access No Publisher: Institute of Electrical and Electronics Engineers
Cite Score: 16.2 Open Access No Publisher: Institute of Electrical and Electronics Engineers
Cite Score: 16.0 Open Access No Publisher: Institute of Electrical and Electronics Engineers
Cite Score: 15.7 Open Access No Publisher: Elsevier Ltd.
Cite Score: 15.5 Open Access No Publisher: Elsevier BV
Cite Score: 15.4 Open Access No Publisher: Tsinghua University Press
Cite Score: 15.2 Open Access No Publisher: Elsevier BV
Cite Score: 15.0 Open Access No Publisher: SAGE Publications
Cite Score: 14.8 Open Access No Publisher: American Chemical Society
Cite Score: 14.6 Open Access No Publisher: Institute of Electrical and Electronics Engineers
Cite Score: 14.4 Open Access No Publisher: Elsevier BV
Cite Score: 14.4 Open Access No Publisher: Institute of Electrical and Electronics Engineers
Cite Score: 14.2 Open Access No Publisher: Elsevier BV
Cite Score: 13.9 Open Access No Publisher: IEEE Computer Society
Cite Score: 13.5 Open Access No Publisher: Elsevier Ltd.
Cite Score: 13.4 Open Access No Publisher: Institute of Electrical and Electronics Engineers
Cite Score: 13.0 Open Access No Publisher: Elsevier Inc.
Cite Score: 12.8 Open Access No Publisher: Institute of Electrical and Electronics Engineers
Cite Score: 12.6 Open Access No Publisher: Chinese Academy of Sciences
Cite Score: 12.5 Open Access Yes Publisher: Institute of Electrical and Electronics Engineers
Cite Score: 12.2 Open Access No Publisher: Institute of Electrical and Electronics Engineers
Cite Score: 11.9 Open Access No Publisher: Institute of Electrical and Electronics Engineers
Cite Score: 11.6 Open Access No Publisher: Elsevier BV
Cite Score: 11.5 Open Access No Publisher: Institute of Physics Publishing
Cite Score: 11.5 Open Access No Publisher: Institute of Electrical and Electronics Engineers
Cite Score: 11.4 Open Access No Publisher: Institute of Electrical and Electronics Engineers
Cite Score: 11.3 Open Access No Publisher: Elsevier Ltd.
Cite Score: 11.2 Open Access No Publisher: Institute of Electrical and Electronics Engineers
Cite Score: 11.0 Open Access No Publisher: Elsevier Ltd.
Cite Score: 11.0 Open Access No Publisher: Institute of Electrical and Electronics Engineers Inc.
Cite Score: 10.9 Open Access No Publisher: Wiley-VCH Verlag
Cite Score: 10.8 Open Access No Publisher: Walter De Gruyter
Cite Score: 10.6 Open Access Yes Publisher: Institute of Electrical and Electronics Engineers
Cite Score: 10.6 Open Access No Publisher: Institute of Electrical and Electronics Engineers
Cite Score: 10.5 Open Access No Publisher: Institute of Electrical and Electronics Engineers
Cite Score: 10.5 Open Access No Publisher: Institute of Electrical and Electronics Engineers
Cite Score: 10.3 Open Access Yes Publisher: Instrument Society of America
Cite Score: 10.2 Open Access No Publisher: Institute of Electrical and Electronics Engineers
Cite Score: 10.1 Open Access No Publisher: Institute of Electrical and Electronics Engineers
Cite Score: 9.7 Open Access No Publisher: Institute of Electrical and Electronics Engineers
Cite Score: 9.7 Open Access No Publisher: IEEE Circuits and Systems Society
Cite Score: 9.7 Open Access No Publisher: Institute of Electrical and Electoronics Engineers
Cite Score: 9.6 Open Access No Publisher: Institute of Electrical and Electronics Engineers
Cite Score: 9.6 Open Access No Publisher: IEEE Advancing Technology for Humanity
Cite Score: 9.4 Open Access No Publisher: Elsevier BV
Cite Score: 9.4 Open Access No Publisher: Elsevier Limited
Cite Score: 9.4 Open Access No Publisher: Institute of Electrical and Electronics Engineers
Cite Score: 9.4 Open Access No Publisher: IEEE Communications Society
Cite Score: 9.3 Open Access No Publisher: Elsevier BV
Cite Score: 9.2 Open Access No Publisher: King Saud University
Cite Score: 9.2 Open Access Yes Publisher: Institute of Electrical and Electronics Engineers Inc.
Cite Score: 9.2 Open Access No Publisher: Institute of Electrical and Electronics Engineers
Cite Score: 9.2 Open Access No Publisher: Institute of Electrical and Electronics Engineers
Cite Score: 9.1 Open Access No Publisher: Nature Publishing Group
Cite Score: 9.0 Open Access Yes Publisher: Institute of Electrical and Electronics Engineers
Cite Score: 9.0 Open Access No Publisher: Techno-Press
Cite Score: 9.0 Open Access No Publisher: Elsevier BV
Cite Score: 8.9 Open Access No Publisher: Institute of Electrical and Electronics Engineers Inc.
Cite Score: 8.9 Open Access No Publisher: Elsevier Ltd.
Cite Score: 8.8 Open Access No Publisher: Kluwer Academic Publishers
Cite Score: 8.6 Open Access No Publisher: Institute of Electrical and Electronics Engineers
Cite Score: 8.6 Open Access No Publisher: Institute of Electrical and Electronics Engineers
Cite Score: 8.5 Open Access No Publisher: Institute of Electrical and Electronics Engineers
Cite Score: 8.5 Open Access No Publisher: Elsevier BV
Cite Score: 8.4 Open Access No Publisher: American Chemical Society
Cite Score: 8.4 Open Access No Publisher: Institute of Electrical and Electronics Engineers
Cite Score: 8.3 Open Access No Publisher: Elsevier Ltd.
Cite Score: 8.3 Open Access No Publisher: Institute of Electrical and Electronics Engineers
Cite Score: 8.3 Open Access No Publisher: Institute of Electrical and Electronics Engineers
Cite Score: 8.3 Open Access No Publisher: Institute of Electrical and Electronics Engineers
Cite Score: 8.2 Open Access No Publisher: Institute of Electrical and Electronics Engineers
Cite Score: 8.1 Open Access No Publisher: Institute of Electrical and Electronics Engineers
Cite Score: 8.0 Open Access No Publisher: IEEE Electron Devices Society
Cite Score: 7.9 Open Access No Publisher: Multidisciplinary Digital Publishing Institute
Cite Score: 7.9 Open Access Yes Publisher: Elsevier Ltd.
Cite Score: 7.8 Open Access No Publisher: Elsevier BV
Cite Score: 7.8 Open Access No Publisher: Elsevier BV
Cite Score: 7.6 Open Access No Publisher: John Wiley & Sons Inc.
Cite Score: 7.6 Open Access Yes Publisher: Elsevier USA
Cite Score: 7.6 Open Access No Publisher: Institute of Electrical and Electronics Engineers
Cite Score: 7.5 Open Access No Publisher: Institute of Electrical and Electronics Engineers
Cite Score: 7.4 Open Access No Publisher: Institute of Electrical and Electronics Engineers
Cite Score: 7.4 Open Access No Publisher: Institute of Electrical and Electronics Engineers
Cite Score: 7.4 Open Access No Publisher: Beilstein-Institut Zur Forderung der Chemischen Wissenschaften
Cite Score: 7.4 Open Access Yes Publisher: Taylor & Francis
Cite Score: 7.2 Open Access No Publisher: Institute of Electrical and Electronics Engineers
Cite Score: 7.2 Open Access No Publisher: Elsevier BV
Cite Score: 7.2 Open Access No Publisher: Institute of Electrical and Electronics Engineers
Cite Score: 7.2 Open Access No Publisher: Wiley-VCH Verlag
Cite Score: 7.1 Open Access No Publisher: Walter de Gruyter GmbH
Cite Score: 6.9 Open Access No Publisher: American Institute of Physics
Cite Score: 6.9 Open Access No Publisher: Institute of Electrical and Electronics Engineers
Cite Score: 6.9 Open Access No Publisher: Springer Verlag
Cite Score: 6.9 Open Access No Publisher: Elsevier BV
Cite Score: 6.9 Open Access No Publisher: John Wiley & Sons Inc.
Cite Score: 6.8 Open Access Yes Publisher: Elsevier BV
Cite Score: 6.8 Open Access No Publisher: Elsevier BV
Cite Score: 6.7 Open Access No Publisher: Elsevier BV
Cite Score: 6.7 Open Access Yes Publisher: Institute of Electrical and Electronics Engineers Inc.
Cite Score: 6.7 Open Access Yes Publisher: Elsevier BV
Cite Score: 6.7 Open Access No Publisher: Institute of Physics Publishing
Cite Score: 6.6 Open Access No Publisher: Elsevier BV
Cite Score: 6.6 Open Access No Publisher: John Wiley & Sons Inc.
Cite Score: 6.6 Open Access No Publisher: John Wiley & Sons Inc.
Cite Score: 6.6 Open Access No Publisher: Institute of Electrical and Electronics Engineers
Cite Score: 6.6 Open Access No Publisher: Institute of Electrical and Electronics Engineers Inc.
Cite Score: 6.5 Open Access Yes Publisher: Nanjing Zidonghua Yanjiusuo/Nanjing Automation Research Institute
Cite Score: 6.5 Open Access No Publisher: Elsevier Limited
Cite Score: 6.5 Open Access No Publisher: Multidisciplinary Digital Publishing Institute (MDPI)
Cite Score: 6.4 Open Access Yes Publisher: Elsevier BV
Cite Score: 6.3 Open Access No Publisher: John Wiley & Sons Inc.
Cite Score: 6.3 Open Access Yes Publisher: Institute of Physics Publishing
Cite Score: 6.2 Open Access No Publisher: IEEE Computer Society
Cite Score: 6.2 Open Access No Publisher: Elsevier Inc.
Cite Score: 6.2 Open Access No Publisher: Institute of Electrical and Electronics Engineers
Cite Score: 6.2 Open Access No Publisher: Institute of Electrical and Electronics Engineers
Cite Score: 6.2 Open Access No Publisher: American Institute of Aeronautics and Astronautics
Cite Score: 6.1 Open Access No Publisher: Elsevier Inc.
Cite Score: 6.1 Open Access No Publisher: Institute of Electrical and Electronics Engineers
Cite Score: 6.1 Open Access No Publisher: Techno-Press
Cite Score: 6.1 Open Access No Publisher: John Wiley & Sons Inc.
Cite Score: 6.1 Open Access Yes Publisher: Institute of Electrical and Electronics Engineers
Cite Score: 6.0 Open Access No Publisher: Institute of Electrical and Electronics Engineers
Cite Score: 5.9 Open Access No Publisher: Institute of Electrical and Electronics Engineers
Cite Score: 5.9 Open Access No Publisher: IEEE Education Society
Cite Score: 5.9 Open Access No Publisher: Institute of Electrical and Electronics Engineers
Cite Score: 5.8 Open Access No Publisher: SAGE Publications
Cite Score: 5.8 Open Access No Publisher: Institute of Electrical and Electronics Engineers
Cite Score: 5.8 Open Access No Publisher: Elsevier BV
Cite Score: 5.8 Open Access No Publisher: Institute of Electrical and Electronics Engineers
Cite Score: 5.8 Open Access No Publisher: Elsevier BV
Cite Score: 5.8 Open Access Yes Publisher: China Institute of Communication
Cite Score: 5.7 Open Access No Publisher: Springer International Publishing AG
Cite Score: 5.7 Open Access Yes Publisher: SpringerOpen
Cite Score: 5.7 Open Access Yes Publisher: Institute of Electrical and Electronics Engineers
Cite Score: 5.7 Open Access No Publisher: Institute of Electrical and Electronics Engineers
Cite Score: 5.7 Open Access No Publisher: Institute of Electrical and Electronics Engineers Inc.
Cite Score: 5.6 Open Access No Publisher: Kluwer Academic Publishers
Cite Score: 5.6 Open Access No Publisher: Power System Technology Press
Cite Score: 5.6 Open Access No Publisher: Springer Verlag
Cite Score: 5.6 Open Access No Publisher: The Institute of Navigation Inc
Cite Score: 5.6 Open Access No Publisher: Institute of Electrical and Electronics Engineers Inc.
Cite Score: 5.6 Open Access No Publisher: Institute of Electrical and Electronics Engineers
Cite Score: 5.5 Open Access No Publisher: Institute of Physics Publishing
Cite Score: 5.5 Open Access No Publisher: John Wiley & Sons Inc.
Cite Score: 5.5 Open Access Yes Publisher: Institute of Electrical and Electronics Engineers
Cite Score: 5.5 Open Access No Publisher: John Wiley & Sons Inc.
Cite Score: 5.5 Open Access Yes Publisher: MDPI AG
Cite Score: 5.5 Open Access Yes Publisher: Institute of Electrical and Electronics Engineers
Cite Score: 5.4 Open Access No Publisher: Elsevier BV
Cite Score: 5.4 Open Access Yes Publisher: Electromagnetics Academy
Cite Score: 5.4 Open Access No Publisher: Institute of Electrical and Electronics Engineers
Cite Score: 5.3 Open Access No Publisher: Institute of Electrical and Electronics Engineers
Cite Score: 5.3 Open Access No Publisher: Institute of Electrical and Electronics Engineers
Cite Score: 5.3 Open Access No Publisher: Institute of Electrical and Electronics Engineers
Cite Score: 5.3 Open Access No Publisher: Taylor & Francis
Cite Score: 5.3 Open Access No Publisher: John Wiley & Sons Inc.
Cite Score: 5.2 Open Access Yes Publisher: Elsevier BV
Cite Score: 5.2 Open Access No Publisher: Institution of Russian Academy of Sciences, Image Processing Systems Institute of RAS
Cite Score: 5.2 Open Access Yes Publisher: Elsevier BV
Cite Score: 5.2 Open Access No Publisher: Springer Nature
Cite Score: 5.2 Open Access No Publisher: Wiley-Blackwell
Cite Score: 5.1 Open Access No Publisher: Zhejiang University Press
Cite Score: 5.1 Open Access No Publisher: Elsevier BV
Cite Score: 5.1 Open Access No Publisher: Elsevier BV
Cite Score: 5.1 Open Access No Publisher: John Wiley & Sons Inc.
Cite Score: 5.0 Open Access No Publisher: Taylor & Francis
Cite Score: 5.0 Open Access No Publisher: John Wiley & Sons Inc.
Cite Score: 5.0 Open Access Yes Publisher: Multidisciplinary Digital Publishing Institute (MDPI)
Cite Score: 5.0 Open Access Yes Publisher: Elsevier BV
Cite Score: 5.0 Open Access No Publisher: Baltzer Science Publishers B.V.
Cite Score: 4.9 Open Access No Publisher: Institute of Physics Publishing
Cite Score: 4.9 Open Access No Publisher: Elsevier BV
Cite Score: 4.9 Open Access No Publisher: Tech Science Press
Cite Score: 4.9 Open Access No Publisher: Institution of Engineering and Technology
Cite Score: 4.8 Open Access Yes Publisher: John Wiley & Sons Inc.
Cite Score: 4.8 Open Access Yes Publisher: Springer Verlag
Cite Score: 4.8 Open Access No Publisher: Institute of Electrical and Electronics Engineers
Cite Score: 4.8 Open Access No Publisher: Multidisciplinary Digital Publishing Institute
Cite Score: 4.8 Open Access Yes Publisher: Institute of Electrical and Electronics Engineers
Cite Score: 4.8 Open Access Yes Publisher: Taylor & Francis
Cite Score: 4.8 Open Access Yes Publisher: Elsevier BV
Cite Score: 4.8 Open Access No Publisher: Elsevier Inc.
Cite Score: 4.8 Open Access No Publisher: Elsevier BV
Cite Score: 4.8 Open Access No Publisher: Taylor and Francis Inc.
Cite Score: 4.8 Open Access No Publisher: SAGE Publications Ltd
Cite Score: 4.7 Open Access No Publisher: Higher Education Press
Cite Score: 4.7 Open Access Yes Publisher: Kluwer Academic Publishers
Cite Score: 4.7 Open Access No Publisher: Zhongguo Dianji Gongcheng Xuehui
Cite Score: 4.7 Open Access No Publisher: John Wiley and Sons Ltd
Cite Score: 4.7 Open Access No Publisher: Baltzer Science Publishers B.V.
Cite Score: 4.7 Open Access No Publisher: Institute of Electrical and Electronics Engineers Inc.
Cite Score: 4.7 Open Access Yes Publisher: Institute of Electrical and Electronics Engineers
Cite Score: 4.5 Open Access No Publisher: Multidisciplinary Digital Publishing Institute (MDPI)
Cite Score: 4.5 Open Access Yes Publisher: Kluwer Academic Publishers
Cite Score: 4.5 Open Access No Publisher: Institute of Electrical and Electronics Engineers Inc.
Cite Score: 4.4 Open Access Yes Publisher: Taylor & Francis
Cite Score: 4.4 Open Access No Publisher: John Wiley & Sons Inc.
Cite Score: 4.4 Open Access Yes Publisher: Institute of Electrical and Electronics Engineers
Cite Score: 4.4 Open Access No Publisher: Wiley-Blackwell
Cite Score: 4.4 Open Access No Publisher: Springer Verlag
Cite Score: 4.4 Open Access No Publisher: John Wiley & Sons Inc.
Cite Score: 4.3 Open Access Yes Publisher: John Wiley & Sons Inc.
Cite Score: 4.3 Open Access Yes Publisher: Copernicus GmbH
Cite Score: 4.3 Open Access Yes Publisher: Kluwer Academic Publishers
Cite Score: 4.2 Open Access No Publisher: Institute of Electrical and Electronics Engineers
Cite Score: 4.2 Open Access No Publisher: Institute of Physics Publishing
Cite Score: 4.2 Open Access No Publisher: Springer Verlag
Cite Score: 4.2 Open Access No Publisher: Institute of Physics Publishing (IOP)
Cite Score: 4.2 Open Access No Publisher: KeAi Communications Co.
Cite Score: 4.2 Open Access Yes Publisher: Institute of Electrical and Electronics Engineers
Cite Score: 4.2 Open Access No Publisher: Institute of Electrical and Electronics Engineers
Cite Score: 4.2 Open Access No Publisher: Science Press
Cite Score: 4.1 Open Access No Publisher: John Wiley & Sons Inc.
Cite Score: 4.1 Open Access Yes Publisher: Elsevier BV
Cite Score: 4.1 Open Access No Publisher: Institute of Electrical and Electronics Engineers Inc.
Cite Score: 4.1 Open Access No Publisher: Elsevier BV
Cite Score: 4.1 Open Access Yes Publisher: Institute of Electrical and Electronics Engineers Inc.
Cite Score: 4.1 Open Access Yes Publisher: Elsevier Ltd.
Cite Score: 4.1 Open Access No Publisher: China Machine Press
Cite Score: 4.1 Open Access No Publisher: Optica Publishing Group
Cite Score: 4.1 Open Access No Publisher: Institute of Physics Publishing
Cite Score: 4.0 Open Access No Publisher: John Wiley and Sons Ltd
Cite Score: 4.0 Open Access Yes Publisher: John Wiley & Sons Inc.
Cite Score: 4.0 Open Access Yes Publisher: John Wiley & Sons Inc.
Cite Score: 4.0 Open Access Yes Publisher: Elsevier BV
Cite Score: 4.0 Open Access No Publisher: Institute of Physics Publishing
Cite Score: 4.0 Open Access No Publisher: Wiley - V C H Verlag GmbbH & Co.
Cite Score: 4.0 Open Access No Publisher: Springer Singapore
Cite Score: 4.0 Open Access No Publisher: Kluwer Academic Publishers
Cite Score: 3.9 Open Access No Publisher: Springer Verlag
Cite Score: 3.9 Open Access No Publisher: China Coal Society
Cite Score: 3.9 Open Access No Publisher: Elsevier BV
Cite Score: 3.9 Open Access No Publisher: Institute of Electrical and Electronics Engineers
Cite Score: 3.9 Open Access No Publisher: Praise Worthy Prize
Cite Score: 3.9 Open Access No Publisher: Institute of Physics Publishing
Cite Score: 3.8 Open Access No Publisher: Power System Protection and Control Press
Cite Score: 3.8 Open Access No Publisher: Optica Publishing Group
Cite Score: 3.8 Open Access No Publisher: SAGE Publications Ltd
Cite Score: 3.8 Open Access Yes Publisher: National Institute for R & D in Informatics
Cite Score: 3.7 Open Access No Publisher: IOP Publishing Ltd.
Cite Score: 3.7 Open Access Yes Publisher: Multidisciplinary Digital Publishing Institute (MDPI)
Cite Score: 3.7 Open Access Yes Publisher: Kluwer Academic Publishers
Cite Score: 3.7 Open Access No Publisher: Institute of Electrical and Electronic Engineers Canada
Cite Score: 3.7 Open Access No Publisher: John Wiley & Sons Inc.
Cite Score: 3.7 Open Access No Publisher: Springer Verlag
Cite Score: 3.7 Open Access Yes Publisher: American Society of Mechanical Engineers
Cite Score: 3.7 Open Access No Publisher: Emerald Group Publishing Ltd.
Cite Score: 3.6 Open Access No Publisher: Springer New York LLC
Cite Score: 3.6 Open Access No Publisher: The Korean Society of Precision Engineering
Cite Score: 3.6 Open Access No Publisher: Institute of Electrical and Electronics Engineers Inc.
Cite Score: 3.6 Open Access No Publisher: Springer International Publishing AG
Cite Score: 3.6 Open Access No Publisher: Taylor and Francis Ltd.
Cite Score: 3.6 Open Access No Publisher: Kluwer Academic Publishers
Cite Score: 3.6 Open Access No Publisher: John Wiley & Sons Inc.
Cite Score: 3.5 Open Access No Publisher: Hindawi Publishing Corporation
Cite Score: 3.5 Open Access Yes Publisher: John Wiley & Sons Inc.
Cite Score: 3.5 Open Access No Publisher: Springer Nature Switzerland AG
Cite Score: 3.5 Open Access Yes Publisher: Electric Power Automation Equipment Press
Cite Score: 3.5 Open Access No Publisher: Multidisciplinary Digital Publishing Institute (MDPI)
Cite Score: 3.5 Open Access Yes Publisher: Kluwer Academic Publishers
Cite Score: 3.5 Open Access No Publisher: Hindawi Limited
Cite Score: 3.5 Open Access Yes Publisher: Elsevier Ltd.
Cite Score: 3.5 Open Access No Publisher: John Wiley & Sons Inc.
Cite Score: 3.5 Open Access No Publisher: Elsevier BV
Cite Score: 3.5 Open Access No Publisher: Institute of Electrical and Electronics Engineers
Cite Score: 3.5 Open Access No Publisher: John Wiley & Sons Inc.
Cite Score: 3.5 Open Access Yes Publisher: Institute of Electrical and Electronics Engineers
Cite Score: 3.5 Open Access No Publisher: The Korean Institute of Electromagnetic Engineering and Science
Cite Score: 3.5 Open Access Yes Publisher: John Wiley & Sons Ltd.
Cite Score: 3.4 Open Access Yes Publisher: John Wiley & Sons Inc.
Cite Score: 3.4 Open Access Yes Publisher: The Institute of Electrical Engineers of Japan
Cite Score: 3.4 Open Access No Publisher: Springer Verlag
Cite Score: 3.4 Open Access No Publisher: Institute of Electrical and Electronics Engineers Inc.
Cite Score: 3.4 Open Access No Publisher: Institute of Electrical and Electronics Engineers
Cite Score: 3.4 Open Access No Publisher: Kluwer Academic/Plenum Publishers
Cite Score: 3.4 Open Access No Publisher: Association for Computing Machinery (ACM)
Cite Score: 3.4 Open Access No Publisher: John Wiley and Sons Inc.
Cite Score: 3.4 Open Access Yes Publisher: Praise Worthy Prize
Cite Score: 3.4 Open Access No Publisher: Springer International Publishing AG
Cite Score: 3.4 Open Access No Publisher: Emerald Group Publishing Ltd.
Cite Score: 3.4 Open Access No Publisher: Taylor and Francis Ltd.
Cite Score: 3.4 Open Access Yes Publisher: Institute of Advanced Engineering and Science (IAES)
Cite Score: 3.3 Open Access No Publisher: Springer Verlag
Cite Score: 3.3 Open Access No Publisher: IEEE Computer Society
Cite Score: 3.3 Open Access No Publisher: Taylor & Francis
Cite Score: 3.2 Open Access No Publisher: S P I E - International Society for Optical Engineering
Cite Score: 3.2 Open Access No Publisher: Kluwer Academic Publishers
Cite Score: 3.2 Open Access No Publisher: Institute of Advanced Engineering and Science (IAES)
Cite Score: 3.2 Open Access No Publisher: Praise Worthy Prize
Cite Score: 3.2 Open Access No Publisher: American Institute of Aeronautics and Astronautics
Cite Score: 3.2 Open Access No Publisher: Hindawi Publishing Corporation
Cite Score: 3.2 Open Access Yes Publisher: John Wiley & Sons Inc.
Cite Score: 3.2 Open Access No Publisher: Elsevier BV
Cite Score: 3.1 Open Access No Publisher: Springer Science + Business Media
Cite Score: 3.1 Open Access No Publisher: AVS Science and Technology Society
Cite Score: 3.1 Open Access No Publisher: Hindawi Publishing Corporation
Cite Score: 3.1 Open Access Yes Publisher: MDPI AG
Cite Score: 3.1 Open Access Yes Publisher: Kexue Chubaneshe/Science Press
Cite Score: 3.1 Open Access No Publisher: Institute of Electrical and Electronics Engineers Inc.
Cite Score: 3.1 Open Access No Publisher: Taylor and Francis Ltd.
Cite Score: 3.1 Open Access Yes Publisher: Elsevier BV
Cite Score: 3.1 Open Access No Publisher: Wiley-Blackwell
Cite Score: 3.1 Open Access No Publisher: Kluwer Academic Publishers
Cite Score: 3.1 Open Access No Publisher: China Electric Power Research Institute
Cite Score: 3.0 Open Access Yes Publisher: Optica Publishing Group
Cite Score: 3.0 Open Access Yes Publisher: World Scientific Publishing Co. Pte Ltd
Cite Score: 3.0 Open Access Yes Publisher: Taylor and Francis
Cite Score: 3.0 Open Access Yes Publisher: Taylor & Francis
Cite Score: 3.0 Open Access No Publisher: John Wiley & Sons Inc.
Cite Score: 3.0 Open Access No Publisher: Taylor & Francis
Cite Score: 2.9 Open Access No Publisher: Taylor & Francis
Cite Score: 2.9 Open Access No Publisher: Universitas Ahmad Dahlan
Cite Score: 2.9 Open Access No Publisher: IOS Press
Cite Score: 2.9 Open Access No Publisher: Institute of Electrical and Electronics Engineers Inc.
Cite Score: 2.9 Open Access Yes Publisher: Taylor & Francis
Cite Score: 2.9 Open Access No Publisher: Springer Verlag
Cite Score: 2.9 Open Access Yes Publisher: IOP Publishing Ltd.
Cite Score: 2.9 Open Access No Publisher: Institute of Electronics Chinese Academy of Sciences
Cite Score: 2.9 Open Access No Publisher: Elsevier BV
Cite Score: 2.9 Open Access Yes Publisher: Springer Verlag
Cite Score: 2.8 Open Access No Publisher: John Wiley & Sons Inc.
Cite Score: 2.8 Open Access Yes Publisher: Taylor & Francis
Cite Score: 2.8 Open Access No Publisher: John Wiley & Sons Inc.
Cite Score: 2.8 Open Access No Publisher: Springer Open
Cite Score: 2.8 Open Access Yes Publisher: The Korean Institute of Electrical and Electronic Material Engineers
Cite Score: 2.8 Open Access No Publisher: Hindawi Publishing Corporation
Cite Score: 2.8 Open Access Yes Publisher: Taylor and Francis Inc.
Cite Score: 2.7 Open Access No Publisher: University of Electronic Science and Technology of China
Cite Score: 2.7 Open Access No Publisher: Warsaw University of Technology
Cite Score: 2.7 Open Access No Publisher: Association for Computing Machinery (ACM)
Cite Score: 2.7 Open Access No Publisher: Institute of Electrical and Electronics Engineers
Cite Score: 2.7 Open Access No Publisher: Kluwer Academic Publishers
Cite Score: 2.7 Open Access No Publisher: Praise Worthy Prize
Cite Score: 2.6 Open Access No Publisher: World Scientific Publishing Co
Cite Score: 2.6 Open Access No Publisher: Springer Science + Business Media
Cite Score: 2.6 Open Access No Publisher: Hindawi Publishing Corporation
Cite Score: 2.6 Open Access Yes Publisher: Pleiades Publishing
Cite Score: 2.6 Open Access No Publisher: Elsevier BV
Cite Score: 2.6 Open Access No Publisher: Springer Science + Business Media
Cite Score: 2.6 Open Access No Publisher: International Association for Educators and Researchers (IAER)
Cite Score: 2.6 Open Access No Publisher: Kauno Technologijos Universitetas
Cite Score: 2.5 Open Access Yes Publisher: Kaunas University of Technology
Cite Score: 2.5 Open Access Yes Publisher: Innovative Information Science and Technology Research Group
Cite Score: 2.5 Open Access No Publisher: EDP Sciences
Cite Score: 2.5 Open Access Yes Publisher: Zhongguo Kexueyuan
Cite Score: 2.5 Open Access No Publisher: University of Suceava
Cite Score: 2.5 Open Access Yes Publisher: Hindawi Publishing Corporation
Cite Score: 2.5 Open Access Yes Publisher: Cambridge University Press
Cite Score: 2.5 Open Access No Publisher: Hindawi Publishing Corporation
Cite Score: 2.5 Open Access No Publisher: Institute of Electrical and Electronics Engineers
Cite Score: 2.4 Open Access No Publisher: Institute of Advanced Engineering and Science (IAES)
Cite Score: 2.4 Open Access No Publisher: Inderscience Publishers
Cite Score: 2.4 Open Access No Publisher: Lavoisier
Cite Score: 2.4 Open Access No Publisher: John Wiley & Sons Inc.
Cite Score: 2.4 Open Access No Publisher: Copernicus Gesellschaften
Cite Score: 2.4 Open Access Yes Publisher: Science Press
Cite Score: 2.4 Open Access No Publisher: Taylor & Francis
Cite Score: 2.4 Open Access No Publisher: Emerald Group Publishing Ltd.
Cite Score: 2.4 Open Access No Publisher: Institute of Advanced Engineering and Science (IAES)
Cite Score: 2.4 Open Access No Publisher: Institute of Advanced Engineering and Science (IAES)
Cite Score: 2.3 Open Access No Publisher: Pleiades Publishing
Cite Score: 2.3 Open Access No Publisher: Japan Laser Processing
Cite Score: 2.3 Open Access No Publisher: Hindawi Publishing Corporation
Cite Score: 2.3 Open Access No Publisher: Emerald Group Publishing Ltd.
Cite Score: 2.3 Open Access No Publisher: Springer Verlag
Cite Score: 2.3 Open Access No Publisher: Walter de Gruyter GmbH
Cite Score: 2.3 Open Access No Publisher: Inderscience Publishers
Cite Score: 2.3 Open Access No Publisher: Korean Institute of Electrical Engineers
Cite Score: 2.2 Open Access No Publisher: Advance Electromagnetics
Cite Score: 2.2 Open Access Yes Publisher: John Wiley & Sons Inc.
Cite Score: 2.2 Open Access No Publisher: State Power Economic Research Institute
Cite Score: 2.2 Open Access No Publisher: Mary Ann Liebert Inc.
Cite Score: 2.2 Open Access No Publisher: EDP Sciences
Cite Score: 2.2 Open Access Yes Publisher: Walter de Gruyter GmbH
Cite Score: 2.2 Open Access Yes Publisher: S P I E - International Society for Optical Engineering
Cite Score: 2.2 Open Access No Publisher: Turpion Ltd
Cite Score: 2.2 Open Access No Publisher: Hindawi Publishing Corporation
Cite Score: 2.2 Open Access Yes Publisher: Sciendo
Cite Score: 2.2 Open Access No Publisher: Scientific and Technical research Council of Turkey - TUBITAK/Turkiye Bilimsel ve Teknik Arastirma Kurumu
Cite Score: 2.1 Open Access No Publisher: Institute of Electrical and Electronics Engineers
Cite Score: 2.1 Open Access No Publisher: University of Split
Cite Score: 2.1 Open Access Yes Publisher: Institute of Electrical and Electronics Engineers
Cite Score: 2.1 Open Access No Publisher: John Wiley & Sons Inc.
Cite Score: 2.1 Open Access Yes Publisher: Taiwan Association of Engineering and Technology Innovation
Cite Score: 2.1 Open Access Yes Publisher: Budapest University of Technology and Economics
Cite Score: 2.1 Open Access No Publisher: Inderscience Publishers
Cite Score: 2.1 Open Access No Publisher: SAGE Publications
Cite Score: 2.1 Open Access No Publisher: Brno University of Technology
Cite Score: 2.1 Open Access Yes Publisher: Pleiades Publishing
Cite Score: 2.0 Open Access No Publisher: University of Mohaghegh Ardabili
Cite Score: 2.0 Open Access No Publisher: Slovenska Technika Univerzita
Cite Score: 2.0 Open Access No Publisher: PC Technology Center
Cite Score: 2.0 Open Access Yes Publisher: Electromagnetics Academy
Cite Score: 2.0 Open Access No Publisher: Korean Institute of Power Electronics
Cite Score: 2.0 Open Access No Publisher: Emerald Group Publishing Ltd.
Cite Score: 2.0 Open Access No Publisher: The Korean Society for Aeronautical & Space Sciences
Cite Score: 1.9 Open Access No Publisher: Walter de Gruyter GmbH
Cite Score: 1.9 Open Access No Publisher: Institute of Electrical and Electronics Engineers Inc.
Cite Score: 1.9 Open Access Yes Publisher: Engineering and Technology Publishing
Cite Score: 1.9 Open Access No Publisher: Polish Academy of Sciences
Cite Score: 1.8 Open Access Yes Publisher: Allerton Press Inc.
Cite Score: 1.8 Open Access No Publisher: Kluwer Academic Publishers
Cite Score: 1.8 Open Access No Publisher: Institut Teknologi Bandung (ITB)
Cite Score: 1.8 Open Access Yes Publisher: World Scientific Publishing Co. Pte Ltd
Cite Score: 1.8 Open Access No Publisher: American Institute of Mathematical Sciences
Cite Score: 1.8 Open Access Yes Publisher: Polish Society of Technical Diagnostics
Cite Score: 1.7 Open Access Yes Publisher: VSB-Technical University of Ostrava
Cite Score: 1.7 Open Access Yes Publisher: ACTA Press
Cite Score: 1.7 Open Access No Publisher: Beijing Advanced Manufacturing Technology Consultation Center
Cite Score: 1.7 Open Access No Publisher: Posts and Telecom Press Co Ltd
Cite Score: 1.7 Open Access No Publisher: Pleiades Publishing
Cite Score: 1.7 Open Access No Publisher: Institute of Electrical and Electronics Engineers
Cite Score: 1.7 Open Access No Publisher: Romanian Society of Control Engineering and Technical Informatics
Cite Score: 1.7 Open Access No Publisher: Taylor & Francis
Cite Score: 1.7 Open Access No Publisher: Haerbin Ligong Daxue/Harbin University of Science and Technology
Cite Score: 1.7 Open Access No Publisher: Walter de Gruyter GmbH
Cite Score: 1.7 Open Access No Publisher: International University of Sarajevo
Cite Score: 1.7 Open Access No Publisher: Taylor and Francis Ltd.
Cite Score: 1.7 Open Access No Publisher: Springer India
Cite Score: 1.6 Open Access No Publisher: University of Zilina
Cite Score: 1.6 Open Access Yes Publisher: Penerbit UTHM
Cite Score: 1.6 Open Access No Publisher: Engineering and Scientific Research Groups (ESR Groups)
Cite Score: 1.6 Open Access No Publisher: China Metrological Measuring Institute
Cite Score: 1.6 Open Access No Publisher: Maruzen Co., Ltd/Maruzen Kabushikikaisha
Cite Score: 1.6 Open Access No Publisher: Maruzen Co., Ltd/Maruzen Kabushikikaisha
Cite Score: 1.6 Open Access No Publisher: Taylor & Francis
Cite Score: 1.6 Open Access No Publisher: Iran University of Science and Technology
Cite Score: 1.6 Open Access No Publisher: Institute of Electrical and Electronics Engineers
Cite Score: 1.6 Open Access No Publisher: Science Press
Cite Score: 1.6 Open Access No Publisher: Inderscience Publishers
Cite Score: 1.6 Open Access No Publisher: Universiti Malaysia Perlis (UniMAP)
Cite Score: 1.6 Open Access No Publisher: Emerald Group Publishing Ltd.
Cite Score: 1.6 Open Access No Publisher: World Scientific Publishing Co
Cite Score: 1.5 Open Access No Publisher: Springer Verlag
Cite Score: 1.5 Open Access No Publisher: Zhongguo Kexueyuan
Cite Score: 1.5 Open Access No Publisher: Institute of Advanced Engineering and Science (IAES)
Cite Score: 1.5 Open Access No Publisher: Editura Academiei Romane
Cite Score: 1.5 Open Access No Publisher: Fuji Technology Press
Cite Score: 1.5 Open Access Yes Publisher: World Scientific Publishing Co
Cite Score: 1.5 Open Access No Publisher: Institute of Electronics, Information and Communication Engineers
Cite Score: 1.5 Open Access No Publisher: Chinese Academy of Sciences
Cite Score: 1.5 Open Access No Publisher: National Institute of Telecommunications
Cite Score: 1.5 Open Access No Publisher: Kluwer Academic/Plenum Publishers
Cite Score: 1.5 Open Access No Publisher: Scientific Association for Infocommunications
Cite Score: 1.5 Open Access No Publisher: Walter de Gruyter GmbH
Cite Score: 1.5 Open Access No Publisher: Defence Scientific Information & Documentation Centre
Cite Score: 1.5 Open Access No Publisher: Inderscience Publishers
Cite Score: 1.5 Open Access No Publisher: Brazilian Microwave and Optoelectronics Society
Cite Score: 1.5 Open Access Yes Publisher: Applied Computational Electromagnetics Society
Cite Score: 1.5 Open Access No Publisher: International Measurement Confederation (IMEKO)
Cite Score: 1.5 Open Access Yes Publisher: World Scientific Publishing Co
Cite Score: 1.4 Open Access No Publisher: Collegio Ingegneri Ferroviari Italiani
Cite Score: 1.4 Open Access No Publisher: China Aerospace Science and Industry Corporation
Cite Score: 1.4 Open Access No Publisher: Institute of Electrical and Electronics Engineers Inc.
Cite Score: 1.4 Open Access Yes Publisher: North Atlantic University Union
Cite Score: 1.4 Open Access No Publisher: Chinese Institute of Electronics
Cite Score: 1.4 Open Access No Publisher: Lavoisier
Cite Score: 1.4 Open Access No Publisher: Taiwan Ubiquitous Information CO LTD
Cite Score: 1.4 Open Access No Publisher: Polish Academy of Sciences,Committee of Electronics and Telecommunications
Cite Score: 1.4 Open Access Yes Publisher: American Scientific Publishers
Cite Score: 1.4 Open Access No Publisher: Xi'an Gaoya Dianqi Yanjiusuo
Cite Score: 1.4 Open Access No Publisher: Springer Verlag
Cite Score: 1.3 Open Access No Publisher: International Information and Engineering Technology Association
Cite Score: 1.3 Open Access No Publisher: Old City Publishing Inc.
Cite Score: 1.3 Open Access No Publisher: Universitat zu Koln
Cite Score: 1.3 Open Access No Publisher: Institutul de Cercetare si Proiectare pentru Electrotehnica
Cite Score: 1.3 Open Access No Publisher: Pleiades Publishing
Cite Score: 1.3 Open Access No Publisher: South African Institute of Electrical Engineers
Cite Score: 1.3 Open Access No Publisher: Gordon and Breach Science Publishers
Cite Score: 1.3 Open Access No Publisher: IOS Press
Cite Score: 1.3 Open Access No Publisher: Inderscience Publishers
Cite Score: 1.2 Open Access No Publisher: International Microelectronics And Packaging Society
Cite Score: 1.2 Open Access No Publisher: The Korean Institute of Information and Commucation Engineering
Cite Score: 1.2 Open Access No Publisher: Taylor & Francis
Cite Score: 1.2 Open Access No Publisher: Pleiades Publishing
Cite Score: 1.2 Open Access No Publisher: Strokovno Drustvo za Mikroelektroniko
Cite Score: 1.2 Open Access Yes Publisher: Maruzen Co., Ltd/Maruzen Kabushikikaisha
Cite Score: 1.2 Open Access No Publisher: China International Book Trading Corp./Zhongguo Guoji Tushu Maoyi Zonggongsi
Cite Score: 1.2 Open Access No Publisher: Inderscience Publishers
Cite Score: 1.2 Open Access No Publisher: Pleiades Publishing
Cite Score: 1.2 Open Access No Publisher: Istanbul University - Cerrahpasa
Cite Score: 1.2 Open Access Yes Publisher: National Aerospace University Kharkiv Aviation Institute
Cite Score: 1.2 Open Access Yes Publisher: Begell House
Cite Score: 1.2 Open Access No Publisher: World Scientific and Engineering Academy and Society
Cite Score: 1.1 Open Access No Publisher: Bentham Science Publishers B.V.
Cite Score: 1.1 Open Access No Publisher: Bentham Science Publishers B.V.
Cite Score: 1.1 Open Access No Publisher: Information Processing Society of Japan
Cite Score: 1.1 Open Access No Publisher: National Academy of Sciences of Ukraine
Cite Score: 1.1 Open Access Yes Publisher: Wiley-Blackwell
Cite Score: 1.1 Open Access No Publisher: MA Healthcare Ltd
Cite Score: 1.1 Open Access No Publisher: Maruzen Co., Ltd/Maruzen Kabushikikaisha
Cite Score: 1.1 Open Access No Publisher: Wydawnictwo SIGMA
Cite Score: 1.1 Open Access No Publisher: Electrical Engineering/Electronics, Computer, Communications and Information Technology Association (ECTI)
Cite Score: 1.1 Open Access No Publisher: Chinese Institute of Automation Engineers (CIAE)
Cite Score: 1.1 Open Access Yes Publisher: Frontiers Media S.A.
Cite Score: 1.1 Open Access Yes Publisher: University of Kragujevac, Faculty of Science
Cite Score: 1.1 Open Access Yes Publisher: National Institute of Research and Development for Optoelectronics
Cite Score: 1.1 Open Access No Publisher: Consultants Bureau
Cite Score: 1.1 Open Access No Publisher: Old City Publishing Inc.
Cite Score: 1.1 Open Access No Publisher: IOS Press
Cite Score: 1.1 Open Access No Publisher: Academy of Sciences of the Czech Republic
Cite Score: 1.0 Open Access No Publisher: Chinese Academy of Space Technology
Cite Score: 1.0 Open Access No Publisher: Magnetics Society of Japan
Cite Score: 1.0 Open Access No Publisher: J.J. Strossmayer University of Osijek, Faculty of Electrical Engineering, Computer Science and Information Technology
Cite Score: 1.0 Open Access No Publisher: River Publishers
Cite Score: 1.0 Open Access No Publisher: Xibei Youse Jinshu Yanjiuyuan
Cite Score: 1.0 Open Access No Publisher: Institute of Electronics and Information Engineers
Cite Score: 1.0 Open Access No Publisher: Islamic Azad University
Cite Score: 1.0 Open Access No Publisher: MM Publishing
Cite Score: 1.0 Open Access No Publisher: Pleiades Publishing
Cite Score: 1.0 Open Access No Publisher: Fujitsu Limted
Cite Score: 0.9 Open Access No Publisher: Znack Publishing House
Cite Score: 0.9 Open Access No Publisher: ACTA Press
Cite Score: 0.9 Open Access No Publisher: Science Press
Cite Score: 0.9 Open Access No Publisher: Inderscience Enterprises
Cite Score: 0.9 Open Access No Publisher: The Institute of Electrical Engineers of Japan
Cite Score: 0.9 Open Access No Publisher: Universidade de Brasilia
Cite Score: 0.9 Open Access Yes Publisher: The Institute of Electronics Engineers of Korea
Cite Score: 0.9 Open Access No Publisher: Wiley-Blackwell
Cite Score: 0.9 Open Access No Publisher: The Korean Magnestics Society
Cite Score: 0.9 Open Access No Publisher: Shanghai Power Equipment Research Institute
Cite Score: 0.9 Open Access No Publisher: Inderscience Enterprises
Cite Score: 0.9 Open Access No Publisher: University of Electronic Science and Technology of China
Cite Score: 0.8 Open Access No Publisher: Institutul National de Cercetare-Dezvoltare pentru Optoelectronica
Cite Score: 0.8 Open Access No Publisher: National Academy of Sciences of Ukraine - Institute of Semiconductor Physics
Cite Score: 0.8 Open Access Yes Publisher: Telecommunications Association
Cite Score: 0.8 Open Access No Publisher: Chinese Association for Cryptologic Research
Cite Score: 0.8 Open Access No Publisher: Elektrotechniska Zveza Slovenije
Cite Score: 0.8 Open Access No Publisher: Faculty of Electrical Engineering Banja Luka
Cite Score: 0.8 Open Access Yes Publisher: John Wiley & Sons Inc.
Cite Score: 0.8 Open Access No Publisher: Electrical Engineering Department, University of Nevada
Cite Score: 0.8 Open Access No Publisher: Inderscience Publishers
Cite Score: 0.8 Open Access No Publisher: Shenyang University of Technology
Cite Score: 0.8 Open Access No Publisher: University of Szeged, Institute of Informatics
Cite Score: 0.7 Open Access No Publisher: Nanjing University of Posts and Telecommunications
Cite Score: 0.7 Open Access No Publisher: Infinite Science Publishing
Cite Score: 0.7 Open Access No Publisher: Guofang Keji Daxue/National University of Defence Technology
Cite Score: 0.7 Open Access No Publisher: Chinese Electronic Periodical Services
Cite Score: 0.6 Open Access No Publisher: The Institute of Electrical Engineers of Japan
Cite Score: 0.6 Open Access No Publisher: Inderscience Enterprises Ltd
Cite Score: 0.6 Open Access No Publisher: Universitatea Politehnica Bucuresti
Cite Score: 0.6 Open Access No Publisher: European Association for the Development of Renewable Energies, Environment and Power Quality
Cite Score: 0.6 Open Access No Publisher: Qiangjiguang Yu Lizishu
Cite Score: 0.6 Open Access No Publisher: China Research Inst of Radiowave Propagation
Cite Score: 0.6 Open Access No Publisher: CIGRE
Cite Score: 0.6 Open Access No Publisher: Sumitomo Electric Industries Ltd.
Cite Score: 0.6 Open Access No Publisher: Inderscience Publishers
Cite Score: 0.6 Open Access No Publisher: Inderscience Publishers
Cite Score: 0.6 Open Access No Publisher: ECTI Association Sirindhon International Institute of Technology
Cite Score: 0.6 Open Access Yes Publisher: Beijing University Press
Cite Score: 0.6 Open Access No Publisher: Springer Verlag
Cite Score: 0.5 Open Access No Publisher: New Technologies Publishing House
Cite Score: 0.5 Open Access No Publisher: Accent Social and Welfare Society
Cite Score: 0.5 Open Access No Publisher: The Institute of Electrical Engineers of Japan
Cite Score: 0.5 Open Access No Publisher: The Institute of Electrical Engineers of Japan
Cite Score: 0.5 Open Access No Publisher: Guojia Jiaowei Quanguo Gaoxiao Chuangan Jishu Yanjiuhui
Cite Score: 0.5 Open Access No Publisher: Tianjin University
Cite Score: 0.5 Open Access No Publisher: Associazione Elettrotecnica ed Elettronica Italiana
Cite Score: 0.5 Open Access No Publisher: ASM International
Cite Score: 0.5 Open Access No Publisher: Korea Institute of Applied Superconductivity and Cryogenics
Cite Score: 0.4 Open Access No Publisher: The Institute of Electrical Engineers of Japan
Cite Score: 0.4 Open Access No Publisher: Korean Institute of Electrical Engineers
Cite Score: 0.4 Open Access Yes Publisher: Chongging Yibiao Cailiao Yanjiusuo/Chongqing Instrument Materials Research Institute
Cite Score: 0.4 Open Access No Publisher: International Thermoelectric Society
Cite Score: 0.4 Open Access No Publisher: National Technical University, Kharkiv Polytechnic Institute
Cite Score: 0.4 Open Access Yes Publisher: Inderscience Publishers
Cite Score: 0.4 Open Access No Publisher: Editura Universitati din Oradea
Cite Score: 0.4 Open Access No Publisher: Chongqing Guangdian Jishu Yanjiusuo
Cite Score: 0.4 Open Access No Publisher: Korean Vacuum Society
Cite Score: 0.3 Open Access No Publisher: Wuhan University of Technology
Cite Score: 0.3 Open Access No Publisher: Society for Microwave Technique, Technologies and Systems and Serbia and Montenegro IEEE MTT-S Chapter
Cite Score: 0.3 Open Access No Publisher: The Society of Systematic Innovation
Cite Score: 0.3 Open Access No Publisher: Societe Francaise de Photogrammetrie et de Teledetection
Cite Score: 0.3 Open Access No Publisher: COMADEM International
Cite Score: 0.3 Open Access No Publisher: Institute of Radio Astronomy of the National Academy of Sciences of Ukraine
Cite Score: 0.3 Open Access Yes Publisher: Illuminating Engineering Institute of Japan
Cite Score: 0.2 Open Access No Publisher: University of Ilorin, Faculty of Engineering and Technology
Cite Score: 0.2 Open Access Yes Publisher: World Scientific and Engineering Academy and Society (WSEAS) Press
Cite Score: 0.2 Open Access No Publisher: Nova Science Publishers Inc.
Cite Score: 0.2 Open Access No Publisher: International Microelectronics And Packaging Society
Cite Score: 0.2 Open Access No Publisher: Institute of Telecommunications Professionals
Cite Score: 0.2 Open Access No Publisher: Firenze University Press
Cite Score: 0.2 Open Access No Publisher: Elsevier Ltd.
Cite Score: 0.1 Open Access Yes Publisher: The Japan Institute of Electronics Packaging
Cite Score: 0.1 Open Access No Publisher: Forex Publication
Cite Score: 0.1 Open Access No Publisher: Universidad de Antioquia
Cite Score: 0.1 Open Access Yes Publisher: Polska Akademia Nauk
Cite Score: 0.1 Open Access Yes Publisher: Institute of Advanced Engineering and Science (IAES)
Cite Score: 0.1 Open Access No Publisher: Nanjing Electronic Devices Institute
Cite Score: 0.1 Open Access No Publisher: World Scientific and Engineering Academy and Society
Cite Score: 0.1 Open Access No Publisher: The Institute of Electrical Engineers of Japan
Cite Score: 0.1 Open Access No Publisher: Eizo Joho Media Gakkai
Cite Score: 0.1 Open Access No Publisher: Voprosy Literatury
Cite Score: 0.1 Open Access No Publisher: Laser Institute of America
Cite Score: 0.0 Open Access No Publisher: Bina Nusantara University
Cite Score: 0.0 Open Access Yes Publisher: International Telecommunication Union
Cite Score: 0.0 Open Access No Publisher: Angel Business Communications Ltd.
Cite Score: 0.0 Open Access No Publisher: Lucent Technologies
Cite Score: Open Access No Publisher: Science Press
Cite Score: Open Access No Publisher: Akif AKGUL
Cite Score: Open Access No Publisher: Canadian Science Publishing
Cite Score: Open Access No Publisher: Editorial Department of Electric Power Engineering Technology
Cite Score: Open Access No Publisher: Now Publishers Inc
Cite Score: Open Access No Publisher: Atomic Energy Press
Cite Score: Open Access No Publisher: Institute of Electrical and Electronics Engineers Inc.
Cite Score: Open Access Yes Publisher: Institute of Electrical and Electronics Engineers Inc.
Cite Score: Open Access Yes Publisher: John Wiley and Sons Inc.
Cite Score: Open Access Yes Publisher: KeAi Communications Co.
Cite Score: Open Access Yes Publisher: Auricle Global Society of Education and Research
Cite Score: Open Access No Publisher: Illuminating Engineering Institute of Japan
Cite Score: Open Access No Publisher: National Research and Innovation Agency (BRIN)
Cite Score: Open Access No Publisher: Springer
Cite Score: Open Access Yes Publisher: American Physical Society
Cite Score: Open Access Yes Publisher: KeAi Communications Co.
Cite Score: Open Access Yes Publisher: Zhongguo Dianli Bianjibu
Cite Score: Open Access No