Sanjiv Kane
@rrcat.gov.in
Scientific Officer-H
Raja Ramanna centre for Advanced Technology
RESEARCH INTERESTS
Synchrotron radiation, XRD. XAFS, Detector development, Pyroelectric materials,
Scopus Publications
Scopus Publications
Rithik Parmar, Pratikkumar Lakhani, Dhavalkumar Bhanderi, Sanjeev Kane, U.K. Goutam, and Chetan K. Modi
Elsevier BV
S.R. Kane, Manvendra Singh, S. Satapathy, P.K. Mehata, P.K. Jha, and Rajashri R. Urkude
Elsevier BV
Mohammed H. Modi, Rajkumar Gupta, Shruti Gupta, Praveen Kumar Yadav, Chander Kant, Sohan Lal, V. K. Raghuvanshi, and S. R. Kane
AIP Publishing
A versatile beamline for performing reflectivity, fluorescence, and absorption experiments in the soft x-ray region of 100–1500 eV is commissioned on a bending magnet port of the Indus-2 synchrotron source. A high vacuum 2-axis reflectometer with x, y, and z sample scanning stages is installed. This reflectometer is used to measure the reflectivity of large samples up to 300 mm in length and 5 kg in weight. This feature is useful for characterizing x-ray optical elements, such as mirrors, gratings, and multilayers. A flange mounted silicon drift detector is installed in the downstream of the reflectometer for soft x-ray fluorescence measurements. The soft x-ray absorption measurements are carried out in the total electron yield and partial fluorescence yield modes. Integration of three different experimental techniques in the experimental station makes the beamline versatile for materials science applications as it provides structural, chemical, and electronic state information by performing the required experiments in an identical environment. The beamline uses a varied line spacing plane grating monochromator and gives a high flux (∼109 to 1011 photon/s) with a moderate resolution (λ/Δλ ~1000–5000). A three-mirror-based higher harmonic setup is incorporated to get rid of harmonics and to get a high spectral purity monochromatic beam with less than 0.1% harmonic content. In the present article, the beamline optical scheme, mechanical configuration, and details of the experimental setups are presented, along with a few representative results of each experimental mode.
Komal Trivedi, Sanjeev R. Kane, U.K. Goutam, Himanshu Srivastava, and Chetan K. Modi
Elsevier BV
Pratikkumar Lakhani, Sanjeev Kane, Himanshu Srivastava, U. K. Goutam, and Chetan K. Modi
Royal Society of Chemistry (RSC)
To enable sustainable chemical transformations, it is imperative to adopt ecofriendly strategies aligned with economic growth and environmental preservation.
Bharat A. Maru, Gaurang J. Bhatt, Urvi Lad, Pradeep T. Deota, Sanjeev Kane, U. K. Goutam, and Chetan K. Modi
Royal Society of Chemistry (RSC)
We fabricated peculiar, highly cogent Fe@g-C3N4 catalysts. Under visible light conditions, Fe@g-C3N4 (1 : 1) catalyst achieved 100% cyclohexanone conversion with 99.85% 2-oxepanone selectivity in the Baeyer–Villiger oxidation reaction.
Sumit, S R Kane, Tapas Ganguli, and Rahul Shukla
IOP Publishing
Abstract In this paper, experimental study for shape control of silicon mirror is done by nonlinear piezoceramic actuator. A piezoelectric unimorph-based silicon mirror (PUSiM) is fabricated using APC 850 piezoceramic for shape control analysis. The piezo response function of all the actuators and profile of PUSiM are measured by confocal sensor at various applied electric fields to verify the nonlinearity of piezoceramic actuator. For comparison, electromechanical coupled finite element model of PUSiM is developed. Recently proposed iterative piezo response function-based optimization is used to calculate the electric field of piezoceramic actuators to achieve the target elliptical profile of PUSiM. At optimum voltage the achieved profile of PUSiM is quite close to the target elliptical profile with 193 nm root-mean-square error. Knowing the nonlinearity inherent in the piezoceramic actuators at high voltages the proposed measurement technique is a way forward for the shape control of structures and deformable mirrors.
Sumit, S R Kane, A K Sinha, Tapas Ganguli, and Rahul Shukla
IOP Publishing
Abstract Shape control of complex structures by optimizing the electrode potential is not achievable directly by analytical solutions and piezo response function base-optimization techniques due to the nonlinear response of piezoactuators. In the present work, a metaheuristic iterative piezo response function (iPRF)-based optimization technique is developed to achieve the arbitrary shape of piezoelectric unimorph (PU) using nonlinear piezoactuators. In this regard, a PU is fabricated using APC 850 piezoactuator to verify the nonlinear response in bending mode and nonlinear analytical model of PU. After verification, length of the inactive layer and number of piezoactuators in PU are modified to study the shape control. iPRF-based technique is used for the optimization of electric potential to achieve the target shape of modified piezoelectric unimorph (MPU) with various piezoactuators. The results of iPRF-based technique are compared with the results of simulated annealing (SA)-based direct optimization technique. Unlike SA-based direct optimization technique, prior knowledge of nonlinear coefficients of piezoactuator is not required in iPRF-based technique. Optimum values obtained from both the direct nonlinear solution- and iPRF-based optimization methods are same for all MPUs. Furthermore, the number of iterations of iPRF-based optimization approach is not affected by the number of piezoactuators used to achieve the desired shape.
Sumit, S. R. Kane, A. K. Sinha, and Rahul Shukla
Informa UK Limited
Sumit, Rahul Shukla, A. K. Sinha, and S. R. Kane
AIP Publishing
Dikin Patel, Sanjeev R. Kane, and Chetan K. Modi
Elsevier BV
Dikin Patel, Komal A. Trivedi, Himanshu Srivastava, Sanjeev R. Kane, and Chetan K. Modi
Elsevier BV
Sumit, S R Kane, A K Sinha, Tapas Ganguli, and Rahul Shukla
IEEE
Linear constitutive equation of piezoelectricity is derived by neglecting the higher order terms in Tayler series expansion of Gibbs potential. At higher electric field, the contribution of higher order terms is significant and linear constitutive equation cannot be used to predict response of piezoelectric actuator. In this paper, a new technique of modification of material parameters (elastic coefficients and piezoelectric strain coefficient) in the linear constitutive equation of piezoelectricity, is proposed to simulate the nonlinear response of piezoceramic actuator. A piezoelectric bimorph (PB) is fabricated to validate the nonlinear response of piezoceramic actuator in bending mode under high electric field. Shear deformation beam theory is used to model the PB and superconvergent finite element with Hamilton principle is used to obtained the numerical solution of PB. Linear and nonlinear tip deflection of PB is compared with the experimental results. The deviation of measured tip deflection from the simulated linear response of PB has increased with the increase of the applied electric field. At 0.2 kV/mm the deviation is approximately 39\\% from the linear response. A modification in material parameters is done to simulate the nonlinear response of PB. As a result, the nonlinear response of PB predicts the experimental results quite accurately.
Dikin Patel, Chetan K. Modi, Prafulla K. Jha, Himanshu Srivastava, and Sanjeev R. Kane
Wiley
Pooja Gupta, P. N. Rao, M. K. Swami, A. Bhakar, Sohan Lal, S. R. Garg, C. K. Garg, P. K. Gauttam, S. R. Kane, V. K. Raghuwanshi,et al.
International Union of Crystallography (IUCr)
A hard X-ray engineering applications beamline (BL-02) was commissioned recently and started operation in March 2019 at the Indian synchrotron source, Indus-2. This bending-magnet-based beamline is capable of operating in various beam modes, viz. white, pink and monochromatic beam. The beamline utilizes the X-ray diffraction technique in energy-dispersive and angle-dispersive modes to carry out experiments mainly focused on engineering problems, viz. stress measurement, texture measurement and determination of elastic constants in a variety of bulk as well as thin-film samples. An open-cradle six-circle diffractometer with ∼12 kg load capacity allows accommodation of a wide variety of engineering samples and qualifies the beamline as a unique facility at Indus-2. The high-resolution mode of this beamline is suitably designed so as to carry out line profile analysis for characterization of micro- and nano-structures. In the present article the beamline is described starting from the beamline design, layout, optics involved, various operational modes and experimental stations. Experiments executed to validate the beamline design parameters and to demonstrate the capabilities of the beamline are also described. The future facilities to be incorporated to enhance the capabilities of the beamline are also discussed.
Ayushi Trivedi, Ajay Khooha, P. Mondal, S. R. Kane, and M. K. Tiwari
AIP Publishing
Pooja Gupta, K.J. Akhila, V. Srihari, Peter Svec, S.R. Kane, S.K. Rai, and Tapas Ganguli
Elsevier BV
S. R. Kane, A. K. Sinha, A. K. Singh, and Shailendra Kumar
AIP Publishing
Pyroelectric detectors are widely used for infrared radiation detection, whereas these can also be used in the X-ray region. They have multiple advantages when used at synchrotron radiation sources, such as (a) can be used with a white beam (high flux), (b) have a flat spectral response, and (c) can be used both as a detector and as a sample. However, when used in the hard X-ray region, absorption in the detector plays an important role depending upon the thickness of the detector. Hence, the estimation of the responsivity of the detector is important. In this paper, we report an improved experimental setup for the measurement of a pyroelectric signal in the hard X-ray region. The responsivity (V/W) of a pyroelectric detector for absorbed radiation in the hard x-ray region is measured. Measurements of the K-edge x-ray absorption fine structure of 10-μm copper and nickel foils are carried out using a LiTaO3 pyroelectric detector and compared with the measurements carried out using an ionization chamber as a sensor for the same foils. Absorption spectra near the Ta LIII and LII edges in LiTaO3, measured using a LiTaO3 crystal both as a sample and as a sensor, are also reported in this paper.
Pooja Gupta, P Švec, A K Sinha, S R Kane, Atit Pandey, S K Rai, and Tapas Ganguli
IOP Publishing
The degree of superlattice ordering (S), which may vary from zero (complete disorder) to one (fully ordered) is known to influence the magnetic and other physical properties of Fe-based nanocrystalline alloys. The direct correlation of S with physical properties of these alloys is not yet established. In the present work, we report on the correlation of the atomic order parameter (S) of bcc-FeCo phase, as calculated by anomalous diffraction measurements with the soft magnetic and mechanical properties of (Fe1-xCox)81Nb7B12 (x = 0.25, 0.33, 0.5, 0.66, 0.75) HITPERM alloys. The measured soft magnetic properties such as coercivity and saturation magnetization are found to have better correlation with the degree of atomic order than that of the crystalline volume fraction for the studied partially nanocrystalline alloys. Highest saturation magnetization (147 A.m2/kg) and lowest coercivity (18 A m−1) is recorded for the alloy (x = 0.66) with maximum degree of atomic order (S ∼ 0.82). Ductility test shows better resistance against the embrittlement for the atomically ordered alloys as compared to disordered ones. Micro-hardness values are also high for atomically ordered alloys. The study suggests that apart from grain size, nanocrystalline fraction etc, the degree of atomic order is also an important structural parameter for tailoring the physical properties of such alloys for technological applications.
Mohammed H. Modi, R. K. Gupta, S. R. Kane, V. Prasad, C. K. Garg, P. Yadav, V. K. Raghuvanshi, Amol Singh, and Mangalika Sinha
Author(s)
Bhavita Mistry, Hiren K. Machhi, Ravi S. Vithalani, Dikin S. Patel, Chetan K. Modi, Meha Prajapati, Kiran R. Surati, Saurabh S. Soni, Prafulla K. Jha, and Sanjeev R. Kane
Royal Society of Chemistry (RSC)
Nowadays, green materials are being discovered to a greater extent to conserve the environment.
Ravi Vithalani, Dikin Patel, Chetan K. Modi, Narayan N. Som, Prafulla K. Jha, and S.R. Kane
Elsevier BV
Gangadhar Das, Ajay Khooha, S. R. Kane, A. K. Singh, and M. K. Tiwari
Author(s)
Analysis of chemical nature and electronic structure at the interface of a thin film medium is important in many technological applications as well as to understand overall efficiency of a thin film device. Synchrotron radiation based x-ray spectroscopy is a promising technique to study interface nature of the nanomaterials with atomic resolutions. A combined x-ray reflectivity and grazing incidence x-ray fluorescence measurement facility has been recently constructed at the BL-16 microfocus beamline of Indus-2 synchrotron facility to accomplish surface-interface microstructural characterization of thin layered materials. It is also possible to analyze contaminates or adsorbed ad-atoms on the surface of the thin nanostructure materials. The BL-16 beamline also provides an attractive platform to perform a variety of analytical research activities especially in the field of micro x-ray fluorescence and ultra-trace elements analysis using Synchrotron radiation. We describe various salient features of the BL-...
S. R. Kane, Shailendra Kumar, Haranath Ghosh, Ajit Kumar Singh, and M. K. Tiwari
Springer Science and Business Media LLC
Gangadhar Das, S. R. Kane, Ajay Khooha, A. K. Singh, and M. K. Tiwari
AIP Publishing
A new multipurpose x-ray reflectometer station has been developed and augmented at the microfocus beamline (BL-16) of Indus-2 synchrotron radiation source to facilitate synchronous measurements of specular x-ray reflectivity and grazing incidence x-ray fluorescence emission from thin layered structures. The design and various salient features of the x-ray reflectometer are discussed. The performance of the reflectometer has been evaluated by analyzing several thin layered structures having different surface interface properties. The results reveal in-depth information for precise determination of surface and interface properties of thin layered materials demonstrating the immense potential of the combined measurements of x-ray reflectivity and grazing incidence fluorescence on a single reflectometer.