- A Performance Analysis of a Real-time Jet Engine Performance Calculator Executing in Arm Cortex-A Multicore Processors
JE Thums, A Sherjil, G Girondi, A Junior, J Gava, G Abich, R Reis, L Ost
2024 31st IEEE International Conference on Electronics, Circuits and Systems 2024
- Early Soft Error Reliability Assessment of Convolutional Neural Networks Executing on Resource-constrained IoT Edge Devices
G Abich, R Reis, L Ost
2024 IEEE International Test Conference (ITC), 207-216 2024
- Power and Performance Costs of Radiation-hardened ML Inference Models Running on Edge Devices
G Abich, AI Silva, J Gava, AA Susin, R Reis, L Ost
2023 36th Symposium on Integrated Circuits and Systems Design (SBCCI), 1-6 2023
- Power, Performance and Reliability Evaluation of Multi-thread Machine Learning Inference Models Executing in Multicore Edge Devices
G Abich, AI Silva, JE Thums, R Silva, AA Susin, R Reis, L Ost
IEEE Computer Society Annual Symposium on VLSI 2023 (ISVLSI), 1-6 2023
- A lightweight mitigation technique for resource-constrained devices executing DNN inference models under neutron radiation
J Gava, A Hanneman, G Abich, R Garibotti, S Cuenca-Asensi, RP Bastos, ...
IEEE Transactions on Nuclear Science 70 (8), 1625-1633 2023
- Soft Error Assessment Methodology
G Abich, L Ost, R Reis
Early Soft Error Reliability Assessment of Convolutional Neural Networks 2023
- Background in ML Models and Radiation Effects
G Abich, L Ost, R Reis
Early Soft Error Reliability Assessment of Convolutional Neural Networks 2023
- Soft Error Reliability Assessment of ML Inference Models Executing on Resource-Constrained IoT Edge Devices
G Abich, L Ost, R Reis
Early Soft Error Reliability Assessment of Convolutional Neural Networks 2023
- Early Soft Error Consistency Assessment
G Abich, L Ost, R Reis
Early Soft Error Reliability Assessment of Convolutional Neural Networks 2023
- Early soft error reliability assessment of convolutional neural networks executing on resource-constrained IoT edge devices
G Abich, L Ost, R Reis
Springer Nature 2023
- 2022 Index IEEE Transactions on Circuits and Systems II: Express Briefs Vol. 69
Z Abbas, J Abdekhoda, S Abdelfattah, D Abdelrahman, B Abdollahi, ...
IEEE Transactions on Circuits and Systems II: Express Briefs 69 (12) 2022
- A Lightweight Mitigation Technique for Resource-constrained Devices under Neutron Radiation
J Gava, G Abich, R Garibotti, S Cuenca-Asensi, RP Bastos, R Reis, L Ost
Conference on Radiation Effects on Components and Systems (RADECS 2022) 2022
- Impact of Thread Parallelism on the Soft Error Reliability of Convolution Neural Networks
G Abich, R Garibotti, J Gava, R Reis, L Ost
2022 IEEE 13th Latin America Symposium on Circuits and System (LASCAS) 1 (1 2022
- The Impact of Soft Errors in Memory Units of Edge Devices Executing Convolutional Neural Networks
G Abich, R Garibotti, R Reis, L Ost
IEEE Transactions on Circuits and Systems II: Express Briefs 69 (3), 679-683 2022
- The Impact of Precision Bitwidth on the Soft Error Reliability of the MobileNet Network
G Abich, R Reis, L Ost
2021 IEEE 12th Latin America Symposium on Circuits and System (LASCAS), 1-4 2022
- Applying Lightweight Soft Error Mitigation Techniques to Embedded Mixed Precision Deep Neural Networks
G Abich, J Gava, R Garibotti, R Reis, L Ost
IEEE Transactions on Circuits and Systems I: Regular Papers 2021
- Evaluation of the soft error assessment consistency of a JIT‐based virtual platform simulator
G Abich, R Garibotti, V Bandeira, F da Rosa, J Gava, F Bortolon, ...
IET Computers & Digital Techniques 15 (2), 125-142 2021
- 2021 Index IEEE Transactions on Circuits and Systems I: Regular Papers Vol. 68
M Abedin, G Abich, AA Abidi, AS Abraham, J Acharya, JM Acken, ...
IEEE Transactions on Circuits and Systems I: Regular Papers 68 (12) 2021
- Soft error reliability assessment of neural networks on resource-constrained IoT devices
G Abich, J Gava, R Reis, L Ost
2020 27th IEEE International Conference on Electronics, Circuits and Systems 2020
- A design patterns-based middleware for multiprocessor systems-on-chip
JC Hamerski, G Abich, R Reis, L Ost, A Amory
2018 31st Symposium on Integrated Circuits and Systems Design (SBCCI), 1-6 2018